- Libros
- Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces
- Libros
- Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces
Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces
WALKOSZ, WERONIKA
English
Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces
WALKOSZ, WERONIKAEAN
9781461428572
Editorial
Year of edition
2013
Idiom
English
Collection
Springer Theses
High
235
Width
155