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  • High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Chattopadhyay, Anupam
English
EAN
9789811010729
Editorial
Year of edition
2017
Idiom
English
Collection
Computer Architecture and Design Methodologies
High
235
Width
155
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