- Libros
- Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
- Libros
- Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Kaczer, Ben
English
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Kaczer, BenEAN
9789402402056
Editorial
Year of edition
2016
Idiom
English
Collection
Springer Series in Advanced Microelectronics
High
235
Width
155