- Libros
- Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
- Libros
- Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Kaczer, Ben
Anglais
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Kaczer, BenEAN
9789400776623
Éditorial
Année d'édition
2013
langage
Anglais
Collection
Springer Series in Advanced Microelectronics
Haute
235
Largeur
155